INTERX paper on manufacturing defect detection published in IEEE TII
Original article in Korean인터엑스, AI분야 최상위 학술지 'IEEE TII' 등재… 불량 원인 '몇 초'를 찾아내다
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Summary
INTERX researchers developed a method to identify manufacturing defects within seconds of data recorded over longer periods. Their paper was published in IEEE Transactions on Industrial Informatics, a top-tier journal in industrial AI.